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期刊文章：
Lei Yun, Jinming Wang, Liqing Yang, Bin Hao, Fei Zhang, Lu Gao, "Belt defect detection based on f-AnoGAN," Proc. SPIE 12787, Sixth International Conference on Advanced Electronic Materials, Computers, and Software Engineering (AEMCSE 2023), 1278709 (16 August 2023); doi:10.1117/12.3004875